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Joint Test Action Group
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#	Item
651	Nios II Hardware Development Tutorial Nios II Hardware Development Tutorial 101 Innovation Drive Add to Reading List Source URL: www.altera.com Language: English - Date: 2011-05-11 18:31:55 Education Altera Quartus Field-programmable gate array Altera Nios embedded processor Joint Test Action Group National Institute of Open Schooling Hardware description language Embedded system Electronic engineering Electronics Nios II
652	FTDI Delivers Connectivity Solutions for Raspberry Pi Mini Computer Employing highly optimised USB interface ICs to ensure strong performance USB solutions specialist Future Technology Devices International Limited (FT Add to Reading List Source URL: www.ftdichip.com Language: English - Date: 2012-06-19 11:44:51 Embedded systems Universal Serial Bus FTDI USB USB hub Joint Test Action Group RS-232 Serial port USB flash drive Technology Electronics Computer hardware
653	Microsoft Word - SoBi_Firmware Engineer.docx Add to Reading List Source URL: socialbicycles.com Language: English - Date: 2014-09-15 09:47:14 Electronic engineering Atmel AVR Joint Test Action Group Microcontroller Firmware Bicycle sharing system Bicycle Embedded systems Electronics Computer architecture
654	T021607_XC4VFX60 Synopsis V1.0 Heavy ion SEE test of Virtex4 FPGA XC4VFX60 from Xilinx Christian Poivey1, Melanie Berg1, Scott Stansberry2, Mark Friendlich1, Hak Kim1, Dave Petrick3, Ken LaBel3 Add to Reading List Source URL: klabs.org Language: English - Date: 2010-03-13 19:08:56 Electronics manufacturing Electronic engineering Embedded systems Field-programmable gate array Xilinx DUT board Device under test Joint Test Action Group LabVIEW Electronics Manufacturing Technology
655	Powerful FPGA platform simplifies USB 2.0 integration, reduces LSI development time and supports sub-100ms hardware reconfiguration Flexible Morph-IC-II platform from FTDI combines Altera Cyclone®-II FPGA with silicon a Add to Reading List Source URL: www.ftdichip.com Language: English - Date: 2012-06-18 06:43:34 Embedded systems Fabless semiconductor companies Field-programmable gate array Universal Serial Bus FTDI Joint Test Action Group Altera USB flash drive Home computer remakes Electronics Electronic engineering Technology
656	Future Technology Devices International Ltd. Application Note AN_110 Programmers Guide for High Speed FTCJTAG DLL Add to Reading List Source URL: www.ftdichip.com Language: English - Date: 2012-05-14 07:22:22 Electronics manufacturing Joint Test Action Group Dynamic-link library Universal Serial Bus Open Pointer Computing Electronics Computer hardware
657	Application Note AN_177 User Guide For libMPSSE – I2C Document Reference No.: FT_000466 Version 1.4 Issue Date: [removed] Add to Reading List Source URL: www.ftdichip.com Language: English - Date: 2012-05-14 07:23:41 Computer hardware I²C Joint Test Action Group FTDI Universal Serial Bus Microcontrollers PSoC Electronics Technology Embedded systems
658	Future Technology Devices International Ltd. Application Note AN_108 Command Processor for MPSSE and MCU Host Bus Emulation Modes Add to Reading List Source URL: www.ftdichip.com Language: English - Date: 2012-05-14 07:22:21 Computer hardware IBM PC compatibles Electronics manufacturing Joint Test Action Group Intel MCS-51 Serial port Conventional PCI Intel Electronics Computing Microcontrollers
659	Application Note AN_178 User Guide For libMPSSE - SPI Document Reference No.: FT_00492 Version 1.1 Issue Date: [removed] Add to Reading List Source URL: www.ftdichip.com Language: English - Date: 2012-05-14 07:23:42 Serial Peripheral Interface Bus Network protocols Microcontrollers Embedded systems System Packet Interface Joint Test Action Group I²C FTDI Universal Serial Bus Electronics Computer hardware Technology
660	Change-tracking markup shows ALey edits as of 26 Apr 2006: = note that my edits are based on and made to accommodate the primary assumption that the scope of section 13 and the purpose of section 14 should be incorporat Add to Reading List Source URL: grouper.ieee.org Language: English - Date: 2006-06-13 11:20:18 Technology Boundary scan description language Boundary scan Joint Test Action Group Digital electronics Institute of Electrical and Electronics Engineers Design for testing Serial Vector Format Electronics manufacturing Electronic engineering Electronics

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